International Conference on Defects in Semiconductors
International Conference on Defects in Semiconductors is a long running series of scientific meetings which focuses on research into point and extended defects in semiconductors. It developed as a spin off from the International Conference on the Physics of Semiconductors, remaining a satellite meeting from the first conference on Radiation Effects in
Semiconductors in Gatlinburg in 1959 until becoming a separate meeting for ICDS 16. The ICDS covers both basic and applied research topics, with special emphasis on applications of results to semiconducting materials and semiconductors-based device functionality. Traditionally, the ICDS has been held every 2 years in various cities around the world with frequent associated proceedings. The previous conference was held in Matsue, Japan, from 31 July to 4 August 2017 and was attended by researchers from 32 countries.
ICDS 30 is currently taking place in Seattle, United States between 21–26 July 2019. Its proceedings will be published as part of a special topic issue of the Journal of Applied Physics. ICDS 31 will be in Oslo between 25 and 30 July 2021. The 32nd ICDS will be in Beijing in July 2023.
Corbett Prize
The Corbett Prize is awarded at the meetings to a young scientist for an outstanding contribution given at the ICDS. The prize is named in memory of James W. Corbett, one of the pioneers in the field of defects in semiconductors, who was known for helping and encouraging young researchers. The prize has been awarded at every ICDS since 1995.Recipients
Recent and future conference locations
The ICDS venue often rotates between locations in Europe, North America and the far East.| Conference name | Location | Dates | Proceedings |
| ICDS 32 |  Beijing, China | July 2023 | |
 Oslo, Norway | 25–30 July 2021 | ||
 Seattle, United States | 21–26 July 2019 | J. Appl. Phys. | |
 Matsue, Japan | 31 July–4 August 2017 | J. Appl. Phys. | |
 Espoo, Finland | 27–31 July 2015 | J. Appl. Phys | |
| ICDS 27 |  Bologna, Italy | 21–26 July 2013 | AIP Conference Proceedings |
 Nelson, New Zealand | 17–22 July 2011 | - | |
 St Petersburg, Russia | 20–24 July 2009 | - | |
| ICDS 24 | Albuquerque, United States | 22–37 July 2007 | - |
| ICDS 23 | Awaji Island, Japan | 24–29 July 2005 | Physica B |
| ICDS 22 |  Århus, Denmark | 28 July–1 August 2003 | - |
| ICDS 21 |  Giessen, Germany | 16–20 July 2001 | - |
| ICDS 20 | Berkeley, California, United States | 26–30 July 1999 | - |
| ICDS 19 |  Aveiro, Portugal | 21–25 July 1997 |
Related Conferences
- The Gordon Research Conferences host regular semiconductor defect meeting in alternating years to the ICDS.
- The Extended Defects in Semiconductors conference is in alternating years to the ICDS.